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1 Ergebnisse
1
High Temperature and High Humidity Reliability Evaluation o..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Ji, In-Hwan
;
Mathew, Anoop
;
Park, Jae-Hyung
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118095
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10118095&Exemplar=1&LAN=DE A1 Ji, In-Hwan A1 Mathew, Anoop A1 Park, Jae-Hyung A1 Oldham, Neal A1 McCain, Matthew A1 Sabri, Shadi A1 Van Brunt, Edward A1 Hull, Brett A1 Lichtenwalner, Daniel J. A1 Gajewski, Donald A. A1 Palmour, John W. YR 2023 SN 1938-1891 K1 Performance evaluation K1 Schottky diodes K1 Temperature K1 Silicon carbide K1 Schottky barriers K1 Humidity K1 Voltage K1 4H-SiC K1 power diodes K1 HV-H3TRB K1 THB-80 K1 HTRB SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118095 DO https://doi.org/10.1109/IRPS48203.2023.10118095 SF ELIB - SuUB Bremen
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