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Effects of Collected Charge and Drain Area on SE Response o..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Pieper, N.J. ; Xiong, Y. ; Ball, D.R... - p. 1-6 , 2023
Link: https://doi.org/10.1109/IRPS48203.2023.10118115