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1 Ergebnisse
1
Novel Operation Scheme for Suppressing Disturb in HfO2-base..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Hamai, Takamasa
;
Suzuki, Kunifumi
;
Ichihara, Reika
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118125
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Novel Operation Scheme for Suppressing Disturb in HfO2-based FeFET Considering Charge- Trapping-Coupled Polarization Dynamics</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10118125&Exemplar=1&LAN=DE A1 Hamai, Takamasa A1 Suzuki, Kunifumi A1 Ichihara, Reika A1 Higashi, Yusuke A1 Yoshimura, Yoko A1 Sakuma, Kiwamu A1 Ota, Kensuke A1 Takahashi, Kota A1 Matsuo, Kazuhiro A1 Fujii, Shosuke A1 Saitoh, Masumi YR 2023 SN 1938-1891 K1 Voltage K1 Hafnium compounds K1 Reliability K1 Transient analysis K1 FeFETs K1 Stress K1 Physics K1 FeFET K1 memory K1 polarization K1 charge-trap K1 disturb SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118125 DO https://doi.org/10.1109/IRPS48203.2023.10118125 SF ELIB - SuUB Bremen
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