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1 Ergebnisse
1
A Physical Unclonable Function Leveraging Hot Carrier Injec..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Parker, Rachael J.
;
Velamala, Jyothi Bhaskarr A.
;
Shen, Kuan-Yueh James
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118128
RT T1
2023 IEEE International Reliability Physics Symposium (IRPS)
: T1
A Physical Unclonable Function Leveraging Hot Carrier Injection Aging
UL https://suche.suub.uni-bremen.de/peid=ieee-10118128&Exemplar=1&LAN=DE A1 Parker, Rachael J. A1 Velamala, Jyothi Bhaskarr A. A1 Shen, Kuan-Yueh James A1 Johnston, David A1 Chang, Yao-Feng A1 Ramey, Stephen M. A1 Wu, Siang-Jhih Sean A1 Penmatsa, Padma YR 2023 SN 1938-1891 K1 Human computer interaction K1 Bit error rate K1 Hot carrier injection K1 Physical unclonable function K1 FinFETs K1 Silicon K1 Manufacturing K1 Security K1 Entropy K1 Physical Unclonable Functions K1 Hot Carrier Injection K1 SRAM K1 Non-volatile memory K1 Bit Error Rate SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118128 DO https://doi.org/10.1109/IRPS48203.2023.10118128 SF ELIB - SuUB Bremen
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