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1 Ergebnisse
1
Comprehensive study on prediction of endurance properties f..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Sato, H.
;
Shin, H. M.
;
Jung, H.
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118152
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Comprehensive study on prediction of endurance properties from breakdown voltage in high-reliable STT-MRAM</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10118152&Exemplar=1&LAN=DE A1 Sato, H. A1 Shin, H. M. A1 Jung, H. A1 Lee, S. W. A1 Bae, H. A1 Kwon, H. A1 Ryu, K. H. A1 Lim, W. C. A1 Han, Y. S. A1 Jeong, J. H. A1 Lee, J. M A1 Kim, D. S. A1 Lee, K. A1 Lee, J. H. A1 Park, J. H. A1 Song, Y. J. A1 Ji, Y. A1 Seo, B. I. A1 Kim, J.W. A1 Kim, H. H. YR 2023 SN 1938-1891 K1 Accelerometers K1 Breakdown voltage K1 Semiconductor device measurement K1 Voltage measurement K1 Electric breakdown K1 Memory management K1 Life estimation K1 STT-MRAM K1 endurance K1 breakdown voltage SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118152 DO https://doi.org/10.1109/IRPS48203.2023.10118152 SF ELIB - SuUB Bremen
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