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1 Ergebnisse
1
The Effects of $\gamma$ Radiation-Induced Trapped Charges o..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Wang, Yuchong
;
Chen, Siyuan
;
Liu, Fanyu
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118190
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>The Effects of $\gamma$ Radiation-Induced Trapped Charges on Single Event Transient in DSOI Technology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10118190&Exemplar=1&LAN=DE A1 Wang, Yuchong A1 Chen, Siyuan A1 Liu, Fanyu A1 Li, Bo A1 Li, Jiangjiang A1 Huang, Yang A1 Zhang, Tiexin A1 Zhang, Xu A1 Han, Zhengsheng A1 Ye, Tianchun A1 Wan, Jing YR 2023 SN 1938-1891 K1 Single event transients K1 Bipolar transistors K1 Sensitivity K1 Space technology K1 Silicon-on-insulator K1 Threshold voltage K1 Transistors K1 γ radiation K1 single event transient K1 DSOI K1 pulsed laser K1 parasitic bipolar transistor K1 back-gate SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118190 DO https://doi.org/10.1109/IRPS48203.2023.10118190 SF ELIB - SuUB Bremen
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