I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Unique Dependence of the Breakdown Behavior of Normally-OFF..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Joshi, Vipin
;
Gupta, Sayak Dutta
;
Chaudhuri, Rajarshi Roy
. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118195
RT T1
2023 IEEE International Reliability Physics Symposium (IRPS)
: T1
Unique Dependence of the Breakdown Behavior of Normally-OFF Cascode AlGaN/GaN HEMTs on Carrier Transport Through the Carbon-Doped GaN Buffer
UL https://suche.suub.uni-bremen.de/peid=ieee-10118195&Exemplar=1&LAN=DE A1 Joshi, Vipin A1 Gupta, Sayak Dutta A1 Chaudhuri, Rajarshi Roy A1 Shrivastava, Mayank YR 2023 SN 1938-1891 K1 Performance evaluation K1 Breakdown voltage K1 Electric breakdown K1 Doping K1 HEMTs K1 Wide band gap semiconductors K1 Transistors K1 Cascode HEMTs K1 Breakdown Voltage K1 C-doped GaN buffer K1 C-Si co-doping K1 C-doped GaN buffer transport SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118195 DO https://doi.org/10.1109/IRPS48203.2023.10118195 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)