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1 Ergebnisse
1
Investigating Nanowire, Nanosheet and Forksheet FET Hot-Car..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Vandemaele, Michiel
;
Kaczer, Ben
;
Bury, Erik
... - p. 1-10 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118211
RT T1
2023 IEEE International Reliability Physics Symposium (IRPS)
: T1
Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper
UL https://suche.suub.uni-bremen.de/peid=ieee-10118211&Exemplar=1&LAN=DE A1 Vandemaele, Michiel A1 Kaczer, Ben A1 Bury, Erik A1 Franco, Jacopo A1 Chasin, Adrian A1 Makarov, Alexander A1 Mertens, Hans A1 Hellings, Geert A1 Groeseneken, Guido YR 2023 SN 1938-1891 K1 Temperature measurement K1 Field effect transistors K1 Simulated annealing K1 Hot carriers K1 Mathematical models K1 Dielectric measurement K1 Numerical models K1 Border traps K1 carrier energy distribution function K1 forksheet FETs K1 gate-all-around FETs K1 hot-carrier degra-dation K1 interface defects K1 nanosheet FETs K1 nanowire FETs K1 non-equilibrium BTI K1 non-radiative multiphonon model K1 recovery K1 Si-R bond K1 simulations K1 TCAD SP 1 OP 10 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118211 DO https://doi.org/10.1109/IRPS48203.2023.10118211 SF ELIB - SuUB Bremen
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