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1 Ergebnisse
1
Reliability of Memristive Devices for High-Performance Neur..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Xi, Yue
;
Li, Xinyi
;
Chen, Junhao
... - p. 1-7 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118214
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Reliability of Memristive Devices for High-Performance Neuromorphic Computing: (Invited Paper)</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10118214&Exemplar=1&LAN=DE A1 Xi, Yue A1 Li, Xinyi A1 Chen, Junhao A1 Hu, Ruofei A1 Zhang, Qingtian A1 Jiang, Zhixing A1 Xu, Feng A1 Tang, Jianshi YR 2023 SN 1938-1891 K1 Neuromorphic engineering K1 Simulation K1 Semiconductor device reliability K1 Thermal engineering K1 Voltage K1 Reliability engineering K1 Dendrites (neurons) K1 Memristor K1 Neuromorphic Computing K1 Artificial Synapse K1 Artificial Soma K1 Artificial Dendrite SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118214 DO https://doi.org/10.1109/IRPS48203.2023.10118214 SF ELIB - SuUB Bremen
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