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1 Ergebnisse
1
Analysis of SSD Acoustic Noise Generation Mechanism dependi..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Cinar, Yusuf
;
Kim, Junghoon
;
Oh, Eunho
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118247
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Analysis of SSD Acoustic Noise Generation Mechanism depending on NAND operation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10118247&Exemplar=1&LAN=DE A1 Cinar, Yusuf A1 Kim, Junghoon A1 Oh, Eunho A1 Lee, Sungki A1 Kwon, Changsik A1 Park, Jonggyu YR 2023 SN 1938-1891 K1 Vibrations K1 Voltage measurement K1 Voltage fluctuations K1 Solid state drives K1 Acoustic noise K1 Capacitors K1 Vibration measurement K1 Acoustic K1 Reliability K1 SSD SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118247 DO https://doi.org/10.1109/IRPS48203.2023.10118247 SF ELIB - SuUB Bremen
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