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1 Ergebnisse
1
TCAD study of the Holding-Voltage Modulation in Irradiated ..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Zunarelli, Laura
;
Balestra, Luigi
;
Reggiani, Susanna
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118271
RT T1
2023 IEEE International Reliability Physics Symposium (IRPS)
: T1
TCAD study of the Holding-Voltage Modulation in Irradiated SCR-LDMOS for HV ESD Protection
UL https://suche.suub.uni-bremen.de/peid=ieee-10118271&Exemplar=1&LAN=DE A1 Zunarelli, Laura A1 Balestra, Luigi A1 Reggiani, Susanna A1 Sankaralingam, Raj A1 Dissegna, Mariano A1 Boselli, Gianluca YR 2023 SN 1938-1891 K1 Temperature dependence K1 Radiation effects K1 Thyristors K1 Modulation K1 Voltage K1 Ions K1 Reliability K1 ESD K1 SCR K1 high holding K1 TCAD K1 traps SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118271 DO https://doi.org/10.1109/IRPS48203.2023.10118271 SF ELIB - SuUB Bremen
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