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1 Ergebnisse
1
Impact of Trapped Charge Vertical Loss and Lateral Migratio..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Liu, Y. H.
;
Zhan, T. C.
;
Yang, Y. S.
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118289
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Impact of Trapped Charge Vertical Loss and Lateral Migration on Lifetime Estimation of 3-D NAND Flash Memories</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10118289&Exemplar=1&LAN=DE A1 Liu, Y. H. A1 Zhan, T. C. A1 Yang, Y. S. A1 Hsu, C. C. A1 Liu, A. C. A1 Lin, W. YR 2023 SN 1938-1891 K1 Electron traps K1 Temperature distribution K1 Silicon nitride K1 Tunneling K1 Data models K1 Threshold voltage K1 Silicon K1 3-D NAND Flash memory K1 Frenkel-Poole emission K1 positive charge-assisted tunneling K1 thermally assisted tunneling SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118289 DO https://doi.org/10.1109/IRPS48203.2023.10118289 SF ELIB - SuUB Bremen
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