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1 Ergebnisse
1
Soft- and Hard-Error Radiation Reliability of 228 KB $3\mat..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Takahashi, H.
;
Okamoto, Y.
;
Hamada, T.
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118302
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Soft- and Hard-Error Radiation Reliability of 228 KB $3\mathrm{T}+1\mathrm{C}$ Oxide Semiconductor Memory</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10118302&Exemplar=1&LAN=DE A1 Takahashi, H. A1 Okamoto, Y. A1 Hamada, T. A1 Komura, Y. A1 Watanabe, S. A1 Tsuda, K. A1 Sawai, H. A1 Matsuzaki, T. A1 Ando, Y. A1 Onuki, T. A1 Kunitake, H. A1 Yamazaki, S. A1 Kobayashi, D. A1 Ikuta, A. A1 Makino, T. A1 Ohshima, T. YR 2023 SN 1938-1891 K1 Space radiation K1 Random access memory K1 X-rays K1 Logic gates K1 Silicon K1 Transistors K1 Integrated circuit reliability K1 Indium gallium zinc oxide (IGZO) K1 nonvolatile memory K1 oxide semiconductor K1 single event upsets (SEUs) K1 total ionizing dose (TID) SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118302 DO https://doi.org/10.1109/IRPS48203.2023.10118302 SF ELIB - SuUB Bremen
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