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1 Ergebnisse
1
Cryogenic Endurance of Anti-ferroelectric and Ferroelectric..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Hsiang, K.-Y.
;
Lee, J.-Y.
;
Lou, Z.-F.
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118311
RT T1 <cTitle>2023 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Cryogenic Endurance of Anti-ferroelectric and Ferroelectric $\text{Hf}_{1-\mathrm{x}}\text{Zr}_{\mathrm{X}}\mathrm{O}_{2}$ for Quantum Computing Applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10118311&Exemplar=1&LAN=DE A1 Hsiang, K.-Y. A1 Lee, J.-Y. A1 Lou, Z.-F. A1 Chang, F.-S. A1 Li, Z.-X. A1 Liu, C. W. A1 Hou, T.-H. A1 Su, P. A1 Lee, M. H. YR 2023 SN 1938-1891 K1 Temperature K1 Quantum computing K1 Capacitors K1 Morphology K1 Cryogenics K1 Switches K1 Information processing K1 Endurance K1 Cryogenic K1 Ferroelectric K1 Antiferroelectric SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118311 DO https://doi.org/10.1109/IRPS48203.2023.10118311 SF ELIB - SuUB Bremen
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