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1 Ergebnisse
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Challenges and solutions to the defect-centric modeling and..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Martin-Martinez, Javier
;
Diaz-Fortuny, Javier
;
Saraza-Canflanca, Pablo
... - p. 1-9 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118334
RT T1
2023 IEEE International Reliability Physics Symposium (IRPS)
: T1
Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability
UL https://suche.suub.uni-bremen.de/peid=ieee-10118334&Exemplar=1&LAN=DE A1 Martin-Martinez, Javier A1 Diaz-Fortuny, Javier A1 Saraza-Canflanca, Pablo A1 Rodriguez, Rosana A1 Castro-Lopez, Rafael A1 Roca, Elisenda A1 Fernandez, Francisco V. A1 Nafria, Montserrat YR 2023 SN 1938-1891 K1 Semiconductor device modeling K1 Semiconductor device measurement K1 Circuit optimization K1 Stochastic processes K1 Statistical distributions K1 Reliability engineering K1 Transistors K1 Bias Temperature Instability (BTI) K1 Random Telegraph Noise (RTN) K1 Hot Carrier Injection (HCI) K1 variability K1 aging K1 degradation K1 characterization K1 CMOS K1 reliability K1 array K1 Reliability-Aware Design (RAD) SP 1 OP 9 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118334 DO https://doi.org/10.1109/IRPS48203.2023.10118334 SF ELIB - SuUB Bremen
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