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1 Ergebnisse
1
Dielectric Thickness and Fin Width Dependent OFF-State Degr..:
, In:
2023 IEEE International Reliability Physics Symposium (IRPS)
,
Kumar, Akhil S.
;
Uren, Michael J.
;
Smith, Matthew D.
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IRPS48203.2023.10118346
RT T1
2023 IEEE International Reliability Physics Symposium (IRPS)
: T1
Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs
UL https://suche.suub.uni-bremen.de/peid=ieee-10118346&Exemplar=1&LAN=DE A1 Kumar, Akhil S. A1 Uren, Michael J. A1 Smith, Matthew D. A1 Kuball, Martin A1 Parke, Justin A1 Henry, H. George A1 Howell, Robert S. YR 2023 SN 1938-1891 K1 Poisson equations K1 Failure analysis K1 Superlattices K1 Reliability theory K1 Logic gates K1 Dielectrics K1 Wide band gap semiconductors K1 Gallium Nitride K1 SLCFET K1 TDDB K1 lifetime K1 reliability K1 degradation K1 step-stressing K1 noise-analysis K1 3D- TCAD K1 percolation theory K1 traps SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48203.2023.10118346 DO https://doi.org/10.1109/IRPS48203.2023.10118346 SF ELIB - SuUB Bremen
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