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Test Input Selection for Deep Neural Network Enhancement Ba..:

, In: 2023 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER),
Hao, Yao ; Huang, Zhiqiu ; Guo, Hongjing. - p. 534-545 , 2023
Link: https://doi.org/10.1109/SANER56733.2023.00056