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1 Ergebnisse
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Performance analysis of stacked Nano sheet at gate length o..:
, In:
2023 International Conference on Computer Communication and Informatics (ICCCI)
,
Arumugam, Kalaiarasi
;
Prasad, M
;
Rajesha, N
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/ICCCI56745.2023.10128358
RT T1 <cTitle>2023 International Conference on Computer Communication and Informatics (ICCCI)</cTitle>: T1 <Title>Performance analysis of stacked Nano sheet at gate length of 10nm at linear and saturation region</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10128358&Exemplar=1&LAN=DE A1 Arumugam, Kalaiarasi A1 Prasad, M A1 Rajesha, N A1 Anil Kumar, V A1 Muqeet, Mohd. Abdual A1 Suneela, B YR 2023 SN 2473-7577 K1 Performance evaluation K1 Silicon compounds K1 Electric potential K1 Logic gates K1 Ions K1 Nanoscale devices K1 Hafnium compounds K1 Junction-less K1 vertically stacked fins K1 Ion K1 Ioff K1 Ion/Ioff Ratio K1 Trans-conductance and output conductance SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ICCCI56745.2023.10128358 DO https://doi.org/10.1109/ICCCI56745.2023.10128358 SF ELIB - SuUB Bremen
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