I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Defect Exposure in Vegetables and Fruits using Machine Lear..:

, In: 2023 International Conference on Computer Communication and Informatics (ICCCI),
Spandana, S. ; Sathiya, M ; Krishnan, Kesavan. - p. 1-5 , 2023
Link: https://doi.org/10.1109/ICCCI56745.2023.10128504