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1 Ergebnisse
1
A Low-overhead PUF-based Secure Scan Design:
, In:
2023 24th International Symposium on Quality Electronic Design (ISQED)
,
Zhou, Wei
;
Cui, Aijiao
;
Chen, Cassi
. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/ISQED57927.2023.10129349
RT T1
2023 24th International Symposium on Quality Electronic Design (ISQED)
: T1
A Low-overhead PUF-based Secure Scan Design
UL https://suche.suub.uni-bremen.de/peid=ieee-10129349&Exemplar=1&LAN=DE A1 Zhou, Wei A1 Cui, Aijiao A1 Chen, Cassi A1 Qu, Gang YR 2023 SN 1948-3295 K1 Side-channel attacks K1 Resists K1 Programming K1 Physical unclonable function K1 Reliability engineering K1 Silicon K1 Registers K1 scan chain K1 scan-based side-channel attack K1 physical unclonable function (PUF) K1 one-time programming structure (OTPS) K1 obfuscation SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ISQED57927.2023.10129349 DO https://doi.org/10.1109/ISQED57927.2023.10129349 SF ELIB - SuUB Bremen
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