I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
AOI Pattern Detection Study for Fine Pitch Advanced Substra..:
, In:
2023 International Conference on Electronics Packaging (ICEP)
,
Xue, Feng
;
Zou, Zhihua
;
Reynolds, Charles
... - p. 3-4 , 2023
Link:
https://doi.org/10.23919/ICEP58572.2023.10129720
RT T1 <cTitle>2023 International Conference on Electronics Packaging (ICEP)</cTitle>: T1 <Title>AOI Pattern Detection Study for Fine Pitch Advanced Substrate</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10129720&Exemplar=1&LAN=DE A1 Xue, Feng A1 Zou, Zhihua A1 Reynolds, Charles A1 Wassick, Tom A1 Pomerantz, Glenn A1 Tang, Neil A1 Cheng, ChaoLin A1 Martell, Steven A1 Tsuriya, Masahiro YR 2023 K1 Wiring K1 TV K1 System-in-package K1 Phase measurement K1 Optical interconnections K1 Printed circuits K1 Multichip modules K1 AOI K1 Advanced Substrate K1 Defect Detection K1 Inspection K1 Fine Pitch Patterns SP 3 OP 4 LK http://dx.doi.org/https://doi.org/10.23919/ICEP58572.2023.10129720 DO https://doi.org/10.23919/ICEP58572.2023.10129720 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
