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1 Ergebnisse
1
Application of Automated Quality Control in Smart Factories..:
, In:
2023 IEEE International Systems Conference (SysCon)
,
Mandapaka, Subbalakshmi
;
Diaz, Catalina
;
Irisson, Hasbanny
... - p. 1-8 , 2023
Link:
https://doi.org/10.1109/SysCon53073.2023.10131100
RT T1
2023 IEEE International Systems Conference (SysCon)
: T1
Application of Automated Quality Control in Smart Factories - A Deep Learning-based Approach
UL https://suche.suub.uni-bremen.de/peid=ieee-10131100&Exemplar=1&LAN=DE A1 Mandapaka, Subbalakshmi A1 Diaz, Catalina A1 Irisson, Hasbanny A1 Akundi, Aditya A1 Lopez, Viviana A1 Timmer, Douglas YR 2023 SN 2472-9647 K1 Training K1 Analytical models K1 Visualization K1 Manufactured products K1 Prototypes K1 Quality control K1 Object detection K1 deep learning K1 industry 4.0 K1 smart factory K1 machine vision system K1 quality control automation K1 product defect detection K1 CNN K1 object detection K1 object recognition K1 image classification SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/SysCon53073.2023.10131100 DO https://doi.org/10.1109/SysCon53073.2023.10131100 SF ELIB - SuUB Bremen
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