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1 Ergebnisse
1
Frequency Response Characterization of High-Bandwidth Curre..:
, In:
2023 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Jimenez, Sergio J.
;
Nelson, Blake W.
;
Curbow, Austin
.. - p. 69-74 , 2023
Link:
https://doi.org/10.1109/APEC43580.2023.10131165
RT T1 <cTitle>2023 IEEE Applied Power Electronics Conference and Exposition (APEC)</cTitle>: T1 <Title>Frequency Response Characterization of High-Bandwidth Current Viewing Resistors Used in Dynamic Testing of Power Semiconductors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10131165&Exemplar=1&LAN=DE A1 Jimenez, Sergio J. A1 Nelson, Blake W. A1 Curbow, Austin A1 Lemmon, Andrew N. A1 New, Christopher D. YR 2023 SN 2470-6647 K1 Resistors K1 Semiconductor device measurement K1 Sensitivity K1 Pulse measurements K1 Current measurement K1 Bandwidth K1 Power electronics K1 current viewing resistor K1 shunt resistor K1 dynamic characterization K1 double pulse test K1 wide band-gap semiconductors SP 69 OP 74 LK http://dx.doi.org/https://doi.org/10.1109/APEC43580.2023.10131165 DO https://doi.org/10.1109/APEC43580.2023.10131165 SF ELIB - SuUB Bremen
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