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1 Ergebnisse
1
B-TRAN™ Optimization and Performance Characterization:
, In:
2023 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Dong, Mouzhi
;
Yu, Ruiyang
;
Jiang, Yifan
... - p. 1835-1839 , 2023
Link:
https://doi.org/10.1109/APEC43580.2023.10131453
RT T1 <cTitle>2023 IEEE Applied Power Electronics Conference and Exposition (APEC)</cTitle>: T1 <Title>B-TRAN™ Optimization and Performance Characterization</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10131453&Exemplar=1&LAN=DE A1 Dong, Mouzhi A1 Yu, Ruiyang A1 Jiang, Yifan A1 Bu, Jiankang A1 Knapp, Jeffrey A1 Brdar, Daniel YR 2023 SN 2470-6647 K1 Performance evaluation K1 Insulated gate bipolar transistors K1 Breakdown voltage K1 Voltage measurement K1 Cooling K1 Switching loss K1 Switches K1 Bidirectional Switch K1 Low Conduction Loss K1 Double-Sided Cooling K1 Back-to-Back Transistors K1 Bidirectional driver K1 Double-Sided Wafer Fabrication K1 Bidirectional Converters K1 Solid-State Circuit Breakers K1 Matrix Converters SP 1835 OP 1839 LK http://dx.doi.org/https://doi.org/10.1109/APEC43580.2023.10131453 DO https://doi.org/10.1109/APEC43580.2023.10131453 SF ELIB - SuUB Bremen
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