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1 Ergebnisse
1
A GaN DC-DC Converter with In-Situ Detection of Aging-Induc..:
, In:
2023 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Murray, Samantha K.
;
Sigmund, Tudor
;
Trescases, Olivier
- p. 2503-2509 , 2023
Link:
https://doi.org/10.1109/APEC43580.2023.10131494
RT T1 <cTitle>2023 IEEE Applied Power Electronics Conference and Exposition (APEC)</cTitle>: T1 <Title>A GaN DC-DC Converter with In-Situ Detection of Aging-Induced Coss Changes for Device State-of-Health Determination</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10131494&Exemplar=1&LAN=DE A1 Murray, Samantha K. A1 Sigmund, Tudor A1 Trescases, Olivier YR 2023 SN 2470-6647 K1 Temperature measurement K1 Buck converters K1 Measurement techniques K1 Aging K1 Capacitance K1 Power electronics K1 Reliability SP 2503 OP 2509 LK http://dx.doi.org/https://doi.org/10.1109/APEC43580.2023.10131494 DO https://doi.org/10.1109/APEC43580.2023.10131494 SF ELIB - SuUB Bremen
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