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1 Ergebnisse
1
Superior Threshold-Voltage and On-Resistance Stability in G..:
, In:
2023 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Wang, Bixuan
;
Song, Qihao
;
Zhang, Ruizhe
... - p. 661-666 , 2023
Link:
https://doi.org/10.1109/APEC43580.2023.10131618
RT T1 <cTitle>2023 IEEE Applied Power Electronics Conference and Exposition (APEC)</cTitle>: T1 <Title>Superior Threshold-Voltage and On-Resistance Stability in GaN HEMTs Enabled by a Gate ESD Protection Circuit</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10131618&Exemplar=1&LAN=DE A1 Wang, Bixuan A1 Song, Qihao A1 Zhang, Ruizhe A1 Sun, Yi A1 Kong, Pengju A1 Li, Qiang A1 Zhang, Yuhao YR 2023 SN 2470-6647 K1 Electrostatic discharge protection K1 Logic gates K1 HEMTs K1 Threshold voltage K1 Robustness K1 Circuit stability K1 System-on-chip K1 GaN K1 HEMT K1 ESD K1 Gate driver K1 On resistance K1 Stability K1 Reliability SP 661 OP 666 LK http://dx.doi.org/https://doi.org/10.1109/APEC43580.2023.10131618 DO https://doi.org/10.1109/APEC43580.2023.10131618 SF ELIB - SuUB Bremen
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