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1 Ergebnisse
1
Investigating the Relationship Between Kink Voltage and Wid..:
, In:
2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT)
,
Wu, Yi-Zhen
;
Jin, Fu-Yuan
;
Kuo, Ting-Tzu
.. - p. 1-2 , 2023
Link:
https://doi.org/10.1109/VLSI-TSA/VLSI-DAT57221.2023.10..
RT T1 <cTitle>2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT)</cTitle>: T1 <Title>Investigating the Relationship Between Kink Voltage and Width Effect in GaN-on-SiC HEMTs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10133962&Exemplar=1&LAN=DE A1 Wu, Yi-Zhen A1 Jin, Fu-Yuan A1 Kuo, Ting-Tzu A1 Chen, Po-Hsun A1 Chang, Ting-Chang YR 2023 K1 Temperature K1 Voltage K1 HEMTs K1 Very large scale integration K1 Impact ionization K1 Semiconductor process modeling K1 Finite element analysis SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/VLSI-TSA/VLSI-DAT57221.2023.10133962 DO https://doi.org/10.1109/VLSI-TSA/VLSI-DAT57221.2023.10133962 SF ELIB - SuUB Bremen
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