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Layout Hotspot Pattern Clustering Using a Density-based App..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Lin, Ciao-Syun ; Tsai, Pin-Yian ; Liu, Yan-Hsiu... - p. 1-4 , 2023
Link: https://doi.org/10.1109/VLSI-TSA/VLSI-DAT57221.2023.10..