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1 Ergebnisse
1
Enhanced Deep Convolutional Neural Network for Identifying ..:
, In:
2023 International Conference on Wireless Communications Signal Processing and Networking (WiSPNET)
,
Ram, G. Challa
;
Subbarao, M. Venkata
;
Varma, D. Ramesh
. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/WiSPNET57748.2023.10133996
RT T1 <cTitle>2023 International Conference on Wireless Communications Signal Processing and Networking (WiSPNET)</cTitle>: T1 <Title>Enhanced Deep Convolutional Neural Network for Identifying and Classification of Silicon Wafer Faults in IC Fabrication Industries</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10133996&Exemplar=1&LAN=DE A1 Ram, G. Challa A1 Subbarao, M. Venkata A1 Varma, D. Ramesh A1 Krishna, A. Sri YR 2023 K1 Training K1 Semiconductor device modeling K1 Fault diagnosis K1 Wireless communication K1 Production K1 Silicon K1 Convolutional neural networks K1 Wafer defects K1 deep neural network K1 manufacturing defects K1 wafer maps K1 convolutional neural network (CNN) SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/WiSPNET57748.2023.10133996 DO https://doi.org/10.1109/WiSPNET57748.2023.10133996 SF ELIB - SuUB Bremen
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