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Analysis of Monolithic 3D SRAM with Back-End-of-Line-compat..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Lu, Yu-Cheng ; Lee, Ming ; Huang, Zi-Yuan. - p. 1-2 , 2023
Link: https://doi.org/10.1109/VLSI-TSA/VLSI-DAT57221.2023.10..