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1
Prediction of Performance Metrics of Nanosheet Field Effect..:
, In:
2023 International Conference on Recent Advances in Electrical, Electronics, Ubiquitous Communication, and Computational Intelligence (RAEEUCCI)
,
Kumar, R.B. Naveen
;
Rajakumari, V
;
Routray, S.R
. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/RAEEUCCI57140.2023.10134284
RT T1
2023 International Conference on Recent Advances in Electrical, Electronics, Ubiquitous Communication, and Computational Intelligence (RAEEUCCI)
: T1
Prediction of Performance Metrics of Nanosheet Field Effect Transistor with LR and RFR Machine Learning Models
UL https://suche.suub.uni-bremen.de/peid=ieee-10134284&Exemplar=1&LAN=DE A1 Kumar, R.B. Naveen A1 Rajakumari, V A1 Routray, S.R A1 Pradhan, K.P. YR 2023 K1 Measurement K1 Machine learning algorithms K1 Computational modeling K1 Field effect transistors K1 Linear regression K1 Predictive models K1 Prediction algorithms K1 Machine Learning (ML) K1 Technology Computed-Aided Design (TCAD) K1 Nanosheet Field Effect Transistor (NSFET) K1 Random Forest Regression (RFR) SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/RAEEUCCI57140.2023.10134284 DO https://doi.org/10.1109/RAEEUCCI57140.2023.10134284 SF ELIB - SuUB Bremen
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