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1 Ergebnisse
1
Analysis of Vmin Variability in Complex Digital Logic via P..:
, In:
2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT)
,
Chen, Harry H.
- p. 1-4 , 2023
Link:
https://doi.org/10.1109/VLSI-TSA/VLSI-DAT57221.2023.10..
RT T1 <cTitle>2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT)</cTitle>: T1 <Title>Analysis of Vmin Variability in Complex Digital Logic via Post-Silicon Profiling</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10134318&Exemplar=1&LAN=DE A1 Chen, Harry H. YR 2023 K1 Voltage measurement K1 Systematics K1 Sensitivity K1 Power demand K1 Discrete Fourier transforms K1 Production K1 Very large scale integration K1 Vmin K1 timing K1 margin K1 sensitivity K1 stress condition K1 sensor K1 mismatch count K1 systematic SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/VLSI-TSA/VLSI-DAT57221.2023.10134318 DO https://doi.org/10.1109/VLSI-TSA/VLSI-DAT57221.2023.10134318 SF ELIB - SuUB Bremen
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