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Characterization of 4H-SiC PMOSFET with P+ Poly-Si Gate:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Hung, Chia-Lung ; Tsui, Bing-Yue - p. 1-2 , 2023
Link: https://doi.org/10.1109/VLSI-TSA/VLSI-DAT57221.2023.10..