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1 Ergebnisse
1
Threshold Voltage Analysis of E-mode Recessed p-GaN Gate HE..:
, In:
2023 IEEE Devices for Integrated Circuit (DevIC)
,
Bhattacharjee, Hindol
;
Dey, Anup
;
Saha, Avishek
. - p. 71-76 , 2023
Link:
https://doi.org/10.1109/DevIC57758.2023.10134842
RT T1
2023 IEEE Devices for Integrated Circuit (DevIC)
: T1
Threshold Voltage Analysis of E-mode Recessed p-GaN Gate HEMT-A Simulation Based Study
UL https://suche.suub.uni-bremen.de/peid=ieee-10134842&Exemplar=1&LAN=DE A1 Bhattacharjee, Hindol A1 Dey, Anup A1 Saha, Avishek A1 Meher, Preetisudha YR 2023 K1 HEMTs K1 Logic gates K1 Threshold voltage K1 Software K1 Wide band gap semiconductors K1 Semiconductor process modeling K1 MODFETs K1 HEMT device K1 E-mode recesses gate K1 PGaN K1 threshold voltage analysis K1 Silvaco TCAD SP 71 OP 76 LK http://dx.doi.org/https://doi.org/10.1109/DevIC57758.2023.10134842 DO https://doi.org/10.1109/DevIC57758.2023.10134842 SF ELIB - SuUB Bremen
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