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1 Ergebnisse
1
Resonant Method for Determining the Dielectric Characterist..:
, In:
2023 IEEE Devices for Integrated Circuit (DevIC)
,
Kogut, Alexander
;
Nosatiuk, Sergey
;
Benhmimou, Boutaina
... - p. 173-176 , 2023
Link:
https://doi.org/10.1109/DevIC57758.2023.10134861
RT T1
2023 IEEE Devices for Integrated Circuit (DevIC)
: T1
Resonant Method for Determining the Dielectric Characteristics of A Mixture of Small Dispersed Bulk Materials at Ka-Band
UL https://suche.suub.uni-bremen.de/peid=ieee-10134861&Exemplar=1&LAN=DE A1 Kogut, Alexander A1 Nosatiuk, Sergey A1 Benhmimou, Boutaina A1 Lamzouri, Fatima Zahra A1 Laamara, Rachid Ahl A1 Arora, Sandeep Kumar A1 Malik, Praveen Kumar A1 Bakkali, Mohamed El A1 Singh, Rajesh YR 2023 K1 Integrated circuits K1 Dielectric constant K1 Moisture K1 Dielectric losses K1 Measurement techniques K1 Whispering gallery modes K1 Electric variables K1 bulk materials K1 dielectric resonators K1 Ka-Band K1 measurement error K1 resonant method SP 173 OP 176 LK http://dx.doi.org/https://doi.org/10.1109/DevIC57758.2023.10134861 DO https://doi.org/10.1109/DevIC57758.2023.10134861 SF ELIB - SuUB Bremen
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