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Demonstration of L-Channel Tunnel FET with Triple Metal Gat..:
, In:
2023 3rd International conference on Artificial Intelligence and Signal Processing (AISP)
,
MariaKiran, K
;
Pandey, Chandan Kumar
;
Shaik, Asma
. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/AISP57993.2023.10134918
RT T1
2023 3rd International conference on Artificial Intelligence and Signal Processing (AISP)
: T1
Demonstration of L-Channel Tunnel FET with Triple Metal Gate for Next Generation IC Technology
UL https://suche.suub.uni-bremen.de/peid=ieee-10134918&Exemplar=1&LAN=DE A1 MariaKiran, K A1 Pandey, Chandan Kumar A1 Shaik, Asma A1 Nandanapu, Shyra YR 2023 SN 2640-5768 K1 Performance evaluation K1 Integrated circuits K1 TFETs K1 Photonic band gap K1 Logic gates K1 Tunneling K1 Signal processing K1 Ambipolarity K1 DIBL K1 GIDL K1 Low-k gate dielectric K1 Tunnel FET K1 workfunction SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/AISP57993.2023.10134918 DO https://doi.org/10.1109/AISP57993.2023.10134918 SF ELIB - SuUB Bremen
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