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1 Ergebnisse
1
Device Performance Analysis for Different Gate Locations in..:
, In:
2023 IEEE Devices for Integrated Circuit (DevIC)
,
Mahata, Mihir Kumar
;
Chatterjee, Soumyadip
;
Das, Tania
. - p. 119-123 , 2023
Link:
https://doi.org/10.1109/DevIC57758.2023.10134979
RT T1
2023 IEEE Devices for Integrated Circuit (DevIC)
: T1
Device Performance Analysis for Different Gate Locations in AlGaN/GaN HEMT by Silvaco Simulation
UL https://suche.suub.uni-bremen.de/peid=ieee-10134979&Exemplar=1&LAN=DE A1 Mahata, Mihir Kumar A1 Chatterjee, Soumyadip A1 Das, Tania A1 Sarkar, Angsuman YR 2023 K1 Resistance K1 Noise figure K1 Voltage K1 Logic gates K1 HEMTs K1 Wide band gap semiconductors K1 Reliability K1 noise-figure K1 HEMT K1 heterostructure K1 AlGaN/GaN K1 power performance K1 device simulation SP 119 OP 123 LK http://dx.doi.org/https://doi.org/10.1109/DevIC57758.2023.10134979 DO https://doi.org/10.1109/DevIC57758.2023.10134979 SF ELIB - SuUB Bremen
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