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1 Ergebnisse
1
Design Enablement Flow for Circuits with Inherent Obfuscati..:
, In:
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Trommer, J.
;
Bhattacharjee, N.
;
Mikolajick, T.
... - p. 1-6 , 2023
Link:
https://doi.org/10.23919/DATE56975.2023.10136918
RT T1 <cTitle>2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>Design Enablement Flow for Circuits with Inherent Obfuscation based on Reconfigurable Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10136918&Exemplar=1&LAN=DE A1 Trommer, J. A1 Bhattacharjee, N. A1 Mikolajick, T. A1 Huhn, S. A1 Merten, M. A1 Djeridane, M.E. A1 Hassan, M. A1 Drechsler, R. A1 Rai, S. A1 Kavand, N. A1 Darjani, A. A1 Kumar, A. A1 Sessi, V. A1 Drescher, M. A1 Kolodinski, S. A1 Wiatr, M. YR 2023 SN 1558-1101 K1 Semiconductor device modeling K1 Resistance K1 Industries K1 Field effect transistors K1 Silicon-on-insulator K1 Electronic components K1 Libraries K1 Emerging devices K1 reconfigurable circuits K1 EDA K1 modelling K1 CMOS co-integration K1 hardware security SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.23919/DATE56975.2023.10136918 DO https://doi.org/10.23919/DATE56975.2023.10136918 SF ELIB - SuUB Bremen
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