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1 Ergebnisse
1
High Performance and DNU-Recovery Spintronic Retention Latc..:
, In:
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Yan, Aibin
;
Zhou, Zhen
;
Ding, Liang
... - p. 1-2 , 2023
Link:
https://doi.org/10.23919/DATE56975.2023.10136927
RT T1 <cTitle>2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>High Performance and DNU-Recovery Spintronic Retention Latch for Hybrid MTJ/CMOS Technology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10136927&Exemplar=1&LAN=DE A1 Yan, Aibin A1 Zhou, Zhen A1 Ding, Liang A1 Cui, Jie A1 Huang, Zhengfeng A1 Wen, Xiaoqing A1 Girard, Patrick YR 2023 SN 1558-1101 K1 Latches K1 Radiation hardening (electronics) K1 Simulation K1 CMOS technology K1 Inverters K1 Reliability K1 Junctions K1 Radiation hardening K1 latch reliability K1 soft error K1 recovery K1 nonvolatility SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/DATE56975.2023.10136927 DO https://doi.org/10.23919/DATE56975.2023.10136927 SF ELIB - SuUB Bremen
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