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1 Ergebnisse
1
A Novel Fault-Tolerant Architecture for Tiled Matrix Multip..:
, In:
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Bal, Sandeep
;
Mummidi, Chandra Sekhar
;
Da Cruz Ferreira, Victor
.. - p. 1-6 , 2023
Link:
https://doi.org/10.23919/DATE56975.2023.10136985
RT T1 <cTitle>2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>A Novel Fault-Tolerant Architecture for Tiled Matrix Multiplication</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10136985&Exemplar=1&LAN=DE A1 Bal, Sandeep A1 Mummidi, Chandra Sekhar A1 Da Cruz Ferreira, Victor A1 Srinivasan, Sudarshan A1 Kundu, Sandip YR 2023 SN 1558-1101 K1 Fault tolerance K1 Data centers K1 Instruction sets K1 Fault tolerant systems K1 Graphics processing units K1 Machine learning K1 Computer architecture K1 accelerator K1 matrix multiplication K1 abft K1 concurrent error detection K1 low power SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.23919/DATE56975.2023.10136985 DO https://doi.org/10.23919/DATE56975.2023.10136985 SF ELIB - SuUB Bremen
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