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1 Ergebnisse
1
Analog Coverage-driven Selection of Simulation Corners for ..:
, In:
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Sanyal, Sayandeep
;
Hazra, Aritra
;
Dasgupta, Pallab
... - p. 1-6 , 2023
Link:
https://doi.org/10.23919/DATE56975.2023.10136993
RT T1 <cTitle>2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>Analog Coverage-driven Selection of Simulation Corners for AMS Integrated Circuits</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10136993&Exemplar=1&LAN=DE A1 Sanyal, Sayandeep A1 Hazra, Aritra A1 Dasgupta, Pallab A1 Morrison, Scott A1 Surendran, Sudhakar A1 Balasubramanian, Lakshmanan A1 Rahman, Mohammad Moshiur YR 2023 SN 1558-1101 K1 Integrated circuit synthesis K1 Monte Carlo methods K1 Costs K1 Computer bugs K1 Behavioral sciences K1 IP networks K1 Data mining SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.23919/DATE56975.2023.10136993 DO https://doi.org/10.23919/DATE56975.2023.10136993 SF ELIB - SuUB Bremen
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