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1 Ergebnisse
1
A Rapid Reset 8-Transistor Physically Unclonable Function U..:
, In:
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Zheng, Yujin
;
Bystrov, Alex
;
Yakovlev, Alex
- p. 1-2 , 2023
Link:
https://doi.org/10.23919/DATE56975.2023.10136995
RT T1 <cTitle>2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>A Rapid Reset 8-Transistor Physically Unclonable Function Utilising Power Gating</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10136995&Exemplar=1&LAN=DE A1 Zheng, Yujin A1 Bystrov, Alex A1 Yakovlev, Alex YR 2023 SN 1558-1101 K1 Measurement K1 Power measurement K1 Monte Carlo methods K1 Current measurement K1 Random access memory K1 Physical unclonable function K1 Hardware K1 Physically Unclonable Function K1 PUF K1 power gating K1 SRAM K1 metastability K1 data remanence K1 data retention SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/DATE56975.2023.10136995 DO https://doi.org/10.23919/DATE56975.2023.10136995 SF ELIB - SuUB Bremen
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