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1 Ergebnisse
1
Electromigration-aware design technology co-optimization fo..:
, In:
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Mayahinia, Mahta
;
Liu, Hsiao-Hsuan
;
Mishra, Subrat
... - p. 1-6 , 2023
Link:
https://doi.org/10.23919/DATE56975.2023.10137008
RT T1 <cTitle>2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10137008&Exemplar=1&LAN=DE A1 Mayahinia, Mahta A1 Liu, Hsiao-Hsuan A1 Mishra, Subrat A1 Tokei, Zsolt A1 Catthoor, Francky A1 Tahoori, Mehdi YR 2023 SN 1558-1101 K1 Wires K1 Random access memory K1 Very large scale integration K1 Reliability engineering K1 CMOS technology K1 Market research K1 Energy efficiency SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.23919/DATE56975.2023.10137008 DO https://doi.org/10.23919/DATE56975.2023.10137008 SF ELIB - SuUB Bremen
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