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1 Ergebnisse
1
EuFRATE: European FPGA Radiation-hardened Architecture for ..:
, In:
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Bozzoli, Ludovica
;
Catanese, Antonino
;
Fazzoletto, Emilio
... - p. 1-6 , 2023
Link:
https://doi.org/10.23919/DATE56975.2023.10137035
RT T1
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
: T1
EuFRATE: European FPGA Radiation-hardened Architecture for Telecommunications
UL https://suche.suub.uni-bremen.de/peid=ieee-10137035&Exemplar=1&LAN=DE A1 Bozzoli, Ludovica A1 Catanese, Antonino A1 Fazzoletto, Emilio A1 Scarpa, Eugenio A1 Goehringer, Diana A1 Pertuz, Sergio A. A1 Kalms, Lester A1 Wulf, Cornelia A1 Charaf, Najdet A1 Sterpone, Luca A1 Azimi, Sarah A1 Rizzieri, Daniele A1 La Greca, Salvatore Gabriele A1 Codinachs, David Merodio A1 King, Stephen YR 2023 SN 1558-1101 K1 Performance evaluation K1 Radiation hardening (electronics) K1 Fault detection K1 Logic gates K1 Communications technology K1 Orbits K1 Hardware K1 FPGA cluster K1 parallel processing K1 radiation hardening K1 FPGA-FPGA communication SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.23919/DATE56975.2023.10137035 DO https://doi.org/10.23919/DATE56975.2023.10137035 SF ELIB - SuUB Bremen
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