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1 Ergebnisse
1
ISOP: Machine Learning-Assisted Inverse Stack-Up Optimizati..:
, In:
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Chae, Hyunsu
;
Mutnury, Bhyrav
;
Zhu, Keren
... - p. 1-6 , 2023
Link:
https://doi.org/10.23919/DATE56975.2023.10137055
RT T1 <cTitle>2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>ISOP: Machine Learning-Assisted Inverse Stack-Up Optimization for Advanced Package Design</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10137055&Exemplar=1&LAN=DE A1 Chae, Hyunsu A1 Mutnury, Bhyrav A1 Zhu, Keren A1 Wallace, Douglas A1 Winterberg, Douglas A1 De Araujo, Daniel A1 Reddy, Jay A1 Klivans, Adam A1 Pan, David Z. YR 2023 SN 1558-1101 K1 Industries K1 Machine learning algorithms K1 Runtime K1 System performance K1 Printed circuits K1 Integrated circuit interconnections K1 Multichip modules SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.23919/DATE56975.2023.10137055 DO https://doi.org/10.23919/DATE56975.2023.10137055 SF ELIB - SuUB Bremen
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