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1 Ergebnisse
1
Built-in Self-Test and Built-in Self-Repair Strategies With..:
, In:
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Tsai, Yu-Chih
;
Ting, Wen-Chien
;
Wang, Chia-Chun
.. - p. 1-6 , 2023
Link:
https://doi.org/10.23919/DATE56975.2023.10137074
RT T1 <cTitle>2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>Built-in Self-Test and Built-in Self-Repair Strategies Without Golden Signature for Computing in Memory</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10137074&Exemplar=1&LAN=DE A1 Tsai, Yu-Chih A1 Ting, Wen-Chien A1 Wang, Chia-Chun A1 Chang, Chia-Cheng A1 Liu, Ren-Shuo YR 2023 SN 1558-1101 K1 Neural networks K1 Built-in self-test K1 Maintenance engineering K1 Dynamic range K1 Hardware K1 Common Information Model (computing) K1 Image restoration K1 computing in memory K1 built-in self-test K1 built-in self-repair K1 accelerator K1 convolutional neural networks SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.23919/DATE56975.2023.10137074 DO https://doi.org/10.23919/DATE56975.2023.10137074 SF ELIB - SuUB Bremen
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