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1 Ergebnisse
1
Process Variation Resilient Current-Domain Analog In Memory..:
, In:
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Prasad, Kailash
;
Shubham, Sai
;
Biswas, Aditya
. - p. 1-2 , 2023
Link:
https://doi.org/10.23919/DATE56975.2023.10137088
RT T1 <cTitle>2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>Process Variation Resilient Current-Domain Analog In Memory Computing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10137088&Exemplar=1&LAN=DE A1 Prasad, Kailash A1 Shubham, Sai A1 Biswas, Aditya A1 Mekie, Joycee YR 2023 SN 1558-1101 K1 Computer architecture K1 Voltage K1 Machine learning K1 In-memory computing K1 SRAM cells K1 Throughput K1 Energy efficiency SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/DATE56975.2023.10137088 DO https://doi.org/10.23919/DATE56975.2023.10137088 SF ELIB - SuUB Bremen
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