I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Twin ECC: A Data Duplication Based ECC for Strong DRAM Erro..:
, In:
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Bae, Hyeong Kon
;
Chung, Myung Jae
;
Gong, Young-Ho
. - p. 1-6 , 2023
Link:
https://doi.org/10.23919/DATE56975.2023.10137096
RT T1 <cTitle>2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>Twin ECC: A Data Duplication Based ECC for Strong DRAM Error Resilience</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10137096&Exemplar=1&LAN=DE A1 Bae, Hyeong Kon A1 Chung, Myung Jae A1 Gong, Young-Ho A1 Chung, Sung Woo YR 2023 SN 1558-1101 K1 Degradation K1 Random access memory K1 Data protection K1 Error correction codes K1 Reliability K1 Servers K1 Resilience K1 DRAM reliability K1 data duplication K1 error correction code K1 bitwise operation SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.23919/DATE56975.2023.10137096 DO https://doi.org/10.23919/DATE56975.2023.10137096 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
