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1 Ergebnisse
1
BAFFI: a bit-accurate fault injector for improved dependabi..:
, In:
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
,
Tuzov, Ilya
;
de Andres, David
;
Ruiz, Juan-Carlos
. - p. 1-6 , 2023
Link:
https://doi.org/10.23919/DATE56975.2023.10137300
RT T1 <cTitle>2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)</cTitle>: T1 <Title>BAFFI: a bit-accurate fault injector for improved dependability assessment of FPGA prototypes</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10137300&Exemplar=1&LAN=DE A1 Tuzov, Ilya A1 de Andres, David A1 Ruiz, Juan-Carlos A1 Hernandez, Carles YR 2023 SN 1558-1101 K1 Multicore processing K1 Microcontrollers K1 Prototypes K1 Closed box K1 Logic gates K1 Routing K1 Table lookup K1 Fault injection K1 FPGA K1 configuration memory K1 robustness assessment K1 RISC-V SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.23919/DATE56975.2023.10137300 DO https://doi.org/10.23919/DATE56975.2023.10137300 SF ELIB - SuUB Bremen
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