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A Low-cost Residue-based Scheme for Error-resiliency of RNN..:

, In: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS),
Nosrati, Nooshin ; Navabi, Zainalabedin - p. 83-86 , 2023
Link: https://doi.org/10.1109/DDECS57882.2023.10139388